Technical Specifications

• Measurable materials: Si, SiC, GaAs, and more
• Sample size: Up to 450 mm in diameter ingots
• Cooling: Air, low noise
• Possible applications: Pre-alignment of large ingots before cutting/grinding | Flat/notch detection
• Application example
• Orientation of silicon ingots: Detection of flat and notch positions before grinding
• Up to 8'' in diameter
• Up to 40 cm in length