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SDCOM

It is designed for ultra-fast crystal orientation measurement using the Omega scanning method.

SDCOM

It is designed for ultra-fast crystal orientation measurement using the Omega scanning method.

SDCOM

Category: X-RAY Diffraction

It is designed for ultra-fast crystal orientation measurement using the Omega scanning method.

Specifically designed for small crystals, the Smart X-ray Diffractometer for Crystal Orientation Measurement (SDCOM) can measure the following types of materials:

  • Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP
  • Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3
  • Tetragonal: MgF2, TiO2, SrLaAlO4
  • Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14
  • Orthorhombic: Mg2SiO4, NdGaO3

 Capable of measuring very small crystals down to 1 mm.

It is designed for ultra-fast crystal orientation measurement using the Omega scanning method.

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