Oxford Jupiter XR Atomic Force Microscope (AFM) is the first and only large-sample AFM that provides both high-speed imaging and an extended scanning area in a single scanner. Jupiter enables access to every point on a 200 mm sample with higher resolution, faster scanning, and a simpler user experience, offering versatile solutions for both academic research needs and industrial R&D laboratories.

• Higher resolution than any other large-sample AFMs
• Extended scanning area that is 5-20× faster than most other AFMs, up to 100 μm
• Simplified setup and faster scanning
• Modular design provides maximum flexibility for your needs