Category: X-RAY Diffraction
Designed for ultra-fast crystal orientation and Rocking Curve measurements.
Omega/Theta X-ray diffractometer is a fully automatic vertical three-axis diffractometer designed for orientation determination of various crystals using Omega-Scan, Theta-Scan methods, and Rocking Curve measurements. It features a spacious design capable of accommodating samples and holders up to 450 mm in length and weighing up to 30 kg.
All measurements are automated and accessible through a user-friendly software interface. With Omega Scan, complete lattice orientation can be determined in a single rotation of the sample (5 seconds). Theta Scan is more flexible but results in only one directional component per scan.
The tilt angle can be determined with very high precision; up to 0.001° using Theta Scan. Accuracy for all other crystal directions depends on the angular difference from the perpendicular surface.
The system is modular and equipped with various extensions for specialized purposes such as shape or flat determination, mapping, and different sample holders. Sample tilt is detected optically and can be used to correct the orientation in the resulting data.
Single Crystal Diffractometer
• Fully automatic full lattice orientation measurement of single crystals
• Ultra-fast crystal orientation measurement using Omega scan method
• Automatic Rocking Curve measurement
• Angular resolution of the diffractometer: 0.1 arc sec
• Sample size up to 450 mm
• Suitable for production quality control and research User-friendly and cost-effective
• Convenient sample handling and easy operation
• Advanced, user-friendly software
• Low energy consumption and operating costs Modular design and flexibility
• Various upgrade options
• Customization according to user requirements
Extensions
• Automatic X-Y mapping table
• Omega/Theta - Stacking table
• Omega/Theta - Rocking Curve measurement
• Omega/Theta - Customized sample holders
• Laser scanner for sample shape measurement
• Photographic camera and image processing for flat and notch detection
• Additional sample rotation axis for 3D mapping
• Secondary channel collimator (analyzer)
• Equipment for sample adjustment
Designed for ultra-fast crystal orientation and Rocking Curve measurements.