Desktop single-point measurements

Low-cost desktop lifetime measurement system for characterization of various silicon samples in different preparation stages without built-in automation. Optional manual z-axis for thicker samples up to 156 mm Bricks. Standard software for result visualization.

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Includes an additional resistance measurement option. Resistance measurements are available either for silicon only, or for wafers or Bricks that do not have height adjustment capability. One of these two options must be predefined.

Advantages

Desktop unit for single-point measurements of carrier lifetime, suitable for multiple or monocrystalline silicon samples from crystal growth to final device in various preparation stages.

Small-sized, low-cost, and easy to use. Comes with basic software for result visualization on a small PC or laptop.

Suitable for samples from wafers to Bricks with easy-to-use height adjustment.