A flexible OEM unit for lifetime measurements in various samples, from single crystals to multicrystalline silicon bricks, from grown wafers to wafers with different layers or metallization, for process control. Standard software interface for easy connection to many processing or automation systems.
A flexible OEM unit for lifetime measurements in various samples, from single crystals to multicrystalline silicon bricks, from grown wafers to wafers with different layers or metallization, for process control. Standard software interface for easy connection to many processing or automation systems.
Category: Micro PCD/MPD Grubu
A flexible OEM unit for lifetime measurements in various samples, from single crystals to multicrystalline silicon bricks, from grown wafers to wafers with different layers or metallization, for process control. Standard software interface for easy connection to many processing or automation systems.
Advantages
The focus of this compact device is on measuring minority carrier lifetime and resistance line boxes under µ-PCD or steady-state excitation conditions.
An easy integration OEM unit for production lines of both multicrystalline and monocrystalline silicon wafers, from devices to bricks or ingots, at different preparation stages.
Small size and standard automation interfaces ensure easy integration. Emphasis is placed on long-term reliability and accuracy of measurement results.
Technical Specifications
A flexible OEM unit for lifetime measurements in various samples, from single crystals to multicrystalline silicon bricks, from grown wafers to wafers with different layers or metallization, for process control. Standard software interface for easy connection to many processing or automation systems.
