State-of-the-art system for topographic electrical characterization of multicrystalline Bricks in high-volume production factories. Total measurement times of less than one minute for 1 mm resolution on one face of the Brick. Bricks are automatically rotated to facilitate measurements on all four sides of each Brick.
State-of-the-art system for topographic electrical characterization of multicrystalline Bricks in high-volume production factories. Total measurement times of less than one minute for 1 mm resolution on one face of the Brick. Bricks are automatically rotated to facilitate measurements on all four sides of each Brick.
Category: Micro PCD/MPD Grubu
State-of-the-art system for topographic electrical characterization of multicrystalline Bricks in high-volume production factories. Total measurement times of less than one minute for 1 mm resolution on one face of the Brick. Bricks are automatically rotated to facilitate measurements on all four sides of each Brick.
MDPinline ingot systems are the fastest available measurement tools worldwide for electrical characterization of multicrystalline silicon Bricks. Designed for single Brick measurements in high-volume production factories. Each Brick can be measured from four sides in less than one minute per surface. All maps (lifetime, photoconductivity, resistance) are measured simultaneously.
Advantages
State-of-the-art system for topographic electrical characterization of multicrystalline Bricks in high-volume production factories. Total measurement times of less than one minute for 1 mm resolution on one face of the Brick. Bricks are automatically rotated to facilitate measurements on all four sides of each Brick.
