MDPinline is a compact, high-speed production-integrated mapping tool for quantitative measurements of carrier lifetime. Topograms are measured 'instantly,' in less than one second per wafer, as wafers are conveyed under the device in the factory.

Your Advantages:

• Non-contact, non-destructive semiconductor electrical characterization
• Suitable for Statistical Process Control (SPC) for production integration. Allows for high-speed wafer mapping and identification of materials and processes limiting cell efficiency in early production stages.
• Suitable for single wafer measurements
• Complete two-dimensional wafer maps in less than one second
• Mapping capability: carrier lifetime, resistance line scanning
• Enhanced sensitivity for visualizing defects not visible to the naked eye in processed wafers
• Easy integration, statistical data output, and quality grade definition