Desktop X-ray Diffractometer for Crystal Orientation Measurement (DDCOM) is an automatic system designed for determining the orientation of various crystals using the Omega scanning method.

• Ultra-fast Omega scanning approach
• 200 times faster than the Theta-scan method
• Automatic 3D determination of full lattice orientation
• Determining the entire crystal orientation within 5 seconds
• Efficient workflows for quality control
• Suitable for standard research and industrial workflows
• Azimuth adjustment and marking of crystal orientation
• Pre-programmed parameters for cubic crystal
• State-of-the-art technology and user-friendly software
• High precision up to (1/100)°
• Control of cutting, grinding, and polishing
• Full lattice orientation of single crystals
• Suitable for a wide range of materials in various sizes and weights: 2-12” wafers and up to 20 kg ingots